At the 2004 Microscopy & Microanalysis Meeting in Savannah, GA, Fischione Instruments was the coauthor of two award-winning poster publications. Both publications featured state-of-the-art TEM specimen holder technology developed by Fischione.
The Microscopy Society of America (MSA) Poster Award for Advances in Instrumentation and Techniques: An Ultra-High-Tilt Two-Contact Electrical Biasing Specimen Holder for Electron Holography and Electron Tomography of Semiconductor Devices, by R.E. Dunin-Borkowski of A.C. Twitchett, J.S. Barnard, R.F. Broom, and P.A. Midgley of the University of Cambridge, and A.C. Robins, D.W. Smith, J.J. Gronsky, and P.E. Fischione of E.A. Fischione Instruments, Inc.
MSA Traveling Poster Award: In-Plane Magnetic Field Lorentz Stage for Use in a TEM/STEM, by N.J. Zaluzec, J. Hiller, R.E. Cook, B. Kabius, and D. Miller of Argonne Laboratory, V.V. Metlushko of University of Illinois in Chicago, and T.C. Swihart, D.W. Smith, J.M. Matesa, J.J. Gronsky, and P.E. Fischione of E.A. Fischione Instruments, Inc.