NanoMill® TEM specimen preparation system installed at NCEM

June 30, 2009

A Model 1040 NanoMill® TEM specimen preparation system was installed at the United States National Center for Electron Microscopy (NCEM) located at the Lawrence Berkeley National Laboratory (LBL) in June 2009.  The NanoMill system was chosen to prepare the highest-quality samples for the Department of Energy’s Transmission Electron Aberration-Corrected Microscope (TEAM) microscope.  Recognizing the benefit of the small diameter, inert gas ion beam, combined with low energy and low temperature operation, leading researcher Dr. Christian Kisielowski is using the NanoMillingSM process on a wide variety of samples, including both hard and soft materials.