NanoMill® TEM specimen preparation system wins innovation award

August 31, 2010

At the Microscopy and Microanalysis Meeting held in Portland, Microscopy Today recognized the Fischione Instruments Model 1040 NanoMill® TEM specimen preparation system as one of the best new products across the entire field of microscopy. The NanoMill system was selected because of its importance and usefulness to the microscopy community.