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A Model 1040 NanoMill® TEM specimen preparation system was installed at the United States National Center for Electron Microscopy (NCEM) located at the Lawrence Berkeley National Laboratory (LBL) in June 2009. The NanoMill® System was chosen to prepare the highest-quality samples for the DoE TEAM microscope. Recognizing the benefit of the small diameter, inert gas ion beam, combined with low energy and low temperature operation, leading researcher Dr. Christian Kisielowski is utilizing the NanoMillingsm process on a wide variety of samples, including both hard and soft materials.
Working with scientists at the Lawrence Livermore National Laboratory and the University of California, Davis, Fischione engineers tested an advanced, environmental heating holder in June 2009. This effort was initially funded by a United States Department of Energy (DoE) SBIR grant. The holder allows true in situ experimentation for a broad range of applications such as nanoresearch and catalysis investigations. This holder is a major breakthrough in terms of in situ microscopy. It achieves high temperature operation, pressures to an atmosphere, and minimal drift. Key to this development was the collaboration with the University of Pittsburgh Swanson School of Engineering which provided tremendous support in terms of finite element analysis (FEA).
The Fischione Applications Laboratory was completed in April 2009. It features the full suite of Fischione specimen preparation instrumentation, including the Gen-II Model 1030 ASaP and the state-of-the-art Model 1040 NanoMill® TEM specimen preparation system. Accompanying the CM200 FEG TEM and Hitachi S-4700 FE SEM is a newly-installed Hitachi Model FB-2000A focused ion beam (FIB) system. This range of instrumentation allows virtually any type of TEM or SEM sample to be readily prepared.
On March 17, 2009 the United States Patent and Trademark Office awarded Patent Number 7,504,623 for the Model 1040 NanoMill® TEM specimen preparation system. This is the second patent received for this instrument and clearly demonstrates the innovative technology that this product offers.
On January 20, 2009 the United States Patent and Trademark Office awarded Fischione Instruments Federal Trademark Registration Number 3,565,879 for NanoMill®.
In December 2007, a Fischione Center of Excellence was established at the Danish Technical University in Copenhagen. There, one of each of the conventional Fischione specimen preparation instruments was installed. In addition, collaboration was established for the development of advanced TEM specimen holder technology. During this effort, Fischione personnel worked very closely with Dr. Rafal E. Dunin-Borkowski, the Director of the Center.
In October 2007, the Fischione facility was host for its 6th International Sales Meeting. Agents from 16 countries including Australia, Brazil, England, France, Germany, Greece, India, Israel, Italy, Japan, The Netherlands, Poland, South Korea, Spain, Sweden, and Taiwan were present. In depth product knowledge and competitive analysis were conveyed. The newly commissioned, 40-seat training room was an ideal venue for this meeting. The agents were able to participate in hands-on specimen preparation activities and then analyze the fruits of their labor with the Fischione microscopy instrumentation. Keeping with the tradition of memorable excursions, the agents were treated to an evening in historic Ligonier, PA. Here, they visited Fort Ligonier which pre-dates the United States Revolutionary War and was a strategic fortification along the Forbes Trail. Afterwards, a tour of an 18th century stage-coach stopover and a presentation by a blacksmith demonstrated life in Western Pennsylvania at that point in history.
In July 2007, the building expansion was completed in which 14,000 square feet (1,300 m2) was added to the main facility, bringing the total space to 24,000 square feet (2,230 m2). The expansion houses Applications, Engineering, Sales and Marketing, and Administration. The production area was also renovated to increase efficiency.
On May 22, 2007 the United States Patent and Trademark Office awarded Patent Number 7,219,565 for the Model 2020 Advanced Tomography Holder. The expansion of the patent portfolio is evidence of the Fischione commitment to developing and commercializing innovative technology.
The United States Patent and Trademark Office on November 7, 2006 granted Patent Number 7,132,673 to Fischione Instruments for the Model 1040 NanoMill.
On October 6, 2006 the first Model 1040 NanoMill was installed at The Ohio State University. Professor Hamish Fraser selected the NanoMill because of its unique ability to produce the highest-quality TEM specimens for imaging and analysis in the FEI aberration corrected Titan 80-300.
October 2006, Fischione Instruments broke ground on a 14,000 square foot addition to its existing facility. The new wing will house Administration, Applications, Engineering, Information Technology, and Sales and Marketing. In addition, it will include a dedicated teaching and training room to facilitate short courses and workshops. The new facility will also allow for an increased area for the manufacturing of Fischione’s products. Completion is scheduled for July 2007. “This expansion represents a significant investment that will support the growth of Fischione as it increases its presence in microscopy and nanotechnology applications.” – Paul Fischione, President
On August 26, 2005, The Pittsburgh Business Times announced that Fischione Instruments was selected as one of the fastest growing companies in the Pittsburgh area. This 2005 award joins similar awards in 2004, 2002 and 2001.
On June 30, 2005, Fischione Instruments was awarded a Phase II Small Business Innovation Research (SBIR) grant for the development of precision holder technology for in situ TEM experimentation. Collaborators on this technology development are the Oak Ridge National Laboratory and the University of Pittsburgh Mechanical Engineering Department.
Various Government officials and business development leaders gathered on October 18, 2004 at Fischione Instruments to announce that they are the first recipient of an Innovation Works’ Technology Adoption Grant (TAG). The grant will be used to support collaboration between Fischione and The John A. Swanson Center for Product Innovation at the University of Pittsburgh. The funded project deals with the development of in situ specimen holder technology for TEM. U.S. Congresswoman Melissa A. Hart was the keynote speaker. She indicated that manufacturing is still the largest industry sector in Pennsylvania and accounts for $64 billion of the state’s gross product. Congresswoman Hart cited a landmark study conducted by the international consulting firm, Deloitte, which indicated that Pennsylvania ranks 4th in the nation in its contribution to the country’s gross domestic product. The Congresswoman stressed the importance of retaining and growing manufacturing jobs in companies like Fischione Instruments. Innovation Works president Florri Mendelson acknowledged the need
and opportunity for manufacturers to harness technology as a means
of competitive advantage. Innovation Works is a state-sponsored
organization that provides funding to technology companies in southwestern
Pennsylvania.
On September 22, 2004, Paul Fischione was invited to speak on “Contamination-Free Electron Microscopy” at the Chinese Academy of Sciences, Institute of Physics in Beijing, China. Approximately 50 prominent scientists from leading Chinese microscopy laboratories attended this event.
On August 27, 2004, The Pittsburgh Business Times announced that Fischione Instruments was selected as one of the fastest growing companies in the Pittsburgh area. This 2004 award joins similar awards in 2002 and 2001.
At the 2004 Microscopy & Microanalysis Meeting in Savannah, GA, Fischione Instruments was the co-author on two award-winning poster publications. Both publications featured state-of-the-art TEM specimen holder technology developed by Fischione. MSA Poster Award for Advances in Instrumentation and Techniques: “An Ultra-High-Tilt Two-Contact Electrical Biasing Specimen Holder for Electron Holography and Electron Tomography of Semiconductor Devices”, by R.E. Dunin-Borkowski of A.C. Twitchett, J.S. Barnard, R.F. Broom, P.A. Midgley of the University of Cambridge, and A.C. Robins, D.W. Smith, J.J. Gronsky, and P.E. Fischione of E.A. Fischione Instruments, Inc. MSA Traveling Poster Award: “In-Plane Magnetic Field Lorentz Stage for Use in a TEM/STEM,” by N.J. Zaluzec, J. Hiller, R.E. Cook, B. Kabius, D. Miller of Argonne Laboratory; V.V. Metlushko of University of Illinois in Chicago, and T.C. Swihart, D.W. Smith, J.M. Matesa, J.J. Gronsky, and P.E. Fischione of E.A. Fischione Instruments, Inc.
In May 2004, Fischione Instruments hosted its third annual European Agents Meeting. The venue was the beautiful town of Stressa, Italy. Sweeping views of Lago Maggiore and the Italian Alps welcomed agents from Atomic Force, K-Vision, Analys Konsult, Nanovision, Agar Scientific, Synergie 4, B.G. Technical Support, Elo Servis, Aname, and Icona.
On May 14, 2004, Fischione Instruments was awarded a Phase I Small Business Innovation Research (SBIR) grant for the development of precision holder technology for in situ TEM experimentation. Collaborators on this technology development are the Oak Ridge National Laboratory and the University of Pittsburgh Mechanical Engineering Department.
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