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Automatic Twin-Jet Electropolisher
The industry standard for producing high-quality thin foils for transmission electron microscopy. The twin jets simultaneously polish both sides of the sample, creating electron transparent specimens within a few minutes. Easily adjusted electrolyte flow, polishing voltage, detection sensitivity, jet, and specimen holder positions.


Electropolisher Accessories
Electropolishing accessories include the Model 220 Low Temperature Container, the Model 130 Specimen Punch, and the Model 140 Digital Power Control.

Model 160 Specimen Grinder
Produces specimens of uniform thickness and parallel sides within a few minutes. Easily and precisely controlled. During the grinding process, a graduated dial continuously indicates the specimen thickness.

Model 170 Ultrasonic Disk Cutter
Cut TEM specimens from hard, brittle materials without mechanical or thermal damage. Unique design means that the sample is always presented parallel to the cutting axis. Process is automatically terminated once the specimen has been cut. Optional microscope enables site-specific cutting. Highly effective for cutting disk, cylindrical, or rectangular specimens.


Model 180 XTEM Preparation Kit
The Model 180 XTEM Prep Kit is designed to produce controlled cross-section TEM (XTEM) specimens. Widely used cross-section samples include semiconductor devices which often have multiple layers and thus multiple interfaces, specimens with thin film layers, and composite materials.
Model 190 Cryo-Can
Provides a clean environment for SEM sample imaging and analysis. Contaminants condense onto a removable, cold surface that can be regenerated and reused. The SEM can be used while the Cryo-Can is cooled, even on SEMs without airlocks.
Model 200 Dimpling Grinder
State-of-the-art mechanical grinder for preparing electron microscopy samples. Features grinding rate control, precise indication of specimen thickness, and easy-to-use graphical interface. Accepts mounted specimens from the Model 160 Specimen Grinder.
Model 1010 Ion Mill
A tabletop, PC-controlled precision ion mill and polisher for creating high-quality electron transparent TEM specimens. Fully programmable operation. Uses two independently adjust-able, variable energy hollow anode discharge (HAD) ion sources, liquid nitrogen specimen cooling, low angle milling capabilities, automatic gas control, and an oil-free vacuum system for ultra-clean specimen processing.
Model 1020 Plasma Cleaner (U.S. Patent 5,633,502)
Automatically and quickly removes organic contamination from electron microscopy specimens and specimen holders. A low energy, reactive gas plasma cleans without changing the specimen’s elemental composition or structural characteristics. Readily accepts side-entry specimen holders for all commercial TEMs as well as SEM samples and a wide variety of bulk materials. Features an oil-free vacuum system for optimal processing.
Model 1030 Automated Sample Prep (ASaP) System (Patent Pending)
Powerful, rapid, and flexible tool that significantly enhances the image quality and analytical data derived from SEM and TEM specimens. Combines the features of plasma cleaning, ion beam etching (IBE), reactive ion beam etching (RIBE), reactive ion etching (RIE), and high-resolution coating (HRC). Specimen is under continuous vacuum throughout the preparation process.
Model 1040 NanoMill (U.S. Patent 7,132,673)
Ultra-low-energy, concentrated ion beam is ideal for preparing today’s specimens of advanced materials for TEM imaging and analysis. Unique ion beam technology produces specimens free from amorphous and implanted layers. The NanoMill is capable of post-FIB (focused ion beam) processing and conventional specimen preparation. It is flexible, easily programmable, and ideally suited for high-throughput applications.

Model 2000 Series
Tomography Specimen Holders
Model 3000 Annular Dark Field Detector
For high resolution STEM imaging. Allows simultaneous high angle annular dark field imaging and electron energy less spectroscopy.
Single electron detection capability
and high quantum efficiency. The
detector is pneumatically retractable
from the beam path.




 
© 2008 E.A. Fischione Instruments, Inc.     Site Last Modified April 20, 2008     Site design and programming A to Z Communications, Inc.