Application notes

Looking for help with preparing a sample or specimen for electron microscopy? The links on this page will lead you to applications notes for various instruments. On these pages you will find instrument specific tips, as well as preparation parameters for various materials. If you don't find the specific material you are trying to prepare, contact applications@fischione.com for assistance.

Application note topics

Products referenced

Silicon plan view specimen preparation for transmission electron microscopy

 

Model 160 Specimen Grinder

Model 170 Ultrasonic Disk Cutter

Model 200 Dimpling Grinder

Silicon cross-section specimen preparation for transmission electron microscopy

Model 160 Specimen Grinder

Model 170 Ultrasonic Disk Cutter

Model 180 XTEM Prep Kit

Model 200 Dimpling Grinder

Cutting disk specimens for transmission electron microscopy

Model 170 Ultrasonic Disk Cutter

Plasma cleaning of carbon films for transmission electron microscopy

Model 1020 Plasma Cleaner

Model 1070 NanoClean

Effect of plama cleaning on carbon support films for field emission gun transmission electron microscopy

Model 1020 Plasma Cleaner 

Model 1070 NanoClean

Model 1040 NanoMill® TEM specimen preparation system specimen configuration

Model 1040 NanoMill® TEM specimen preparation system

Removal of amorphous layer from nanoneedle specimens fabricated by focused ion beam

Model 1040 NanoMill® TEM specimen preparation system

Microelectronic device delayering using an adjustable broad‑beam ion source

Model 1040 NanoMill® TEM specimen preparation system

Model 1061 SEM Mill

Shale plan view sample preparation for scanning electron microscopy Model 1061 SEM Mill
Semiconductor sample preparation for scanning electron microscopy Model 1061 SEM Mill
Preparation of a copper plate sample for scanning electron microscopy Model 1061 SEM Mill
Metal plan view sample preparation for electron backscatter diffraction analysis Model 1061 SEM Mill
Multiscale imaging of shale samples in the scanning electron microscope Model 1061 SEM Mill
Metallic sample preparation for EBSD by mechanical method and argon ion beam milling Model 1061 SEM Mill
Preparing cross sections of materials with very different mechanical properties Model 1061 SEM Mill
Cross-section sample preparation using argon ion milling of a diphase paint coating on a polymer substrate Model 1061 SEM Mill
Annular Dark Field Detector operating principles Model 3000 Annular Dark Field (ADF) Detector

 

NanoMill is a registered trademark of E.A. Fischione Instruments, Inc.