We use cookies

By continuing to browse the site, you are agreeing to our use of cookies.

OK Find out more

Sample preparation for electron microscopy

Martensitic steel IPF EBSD (inverse pole figure electron backscattered diffraction) map following preparation using the Model 1062 TrionMill

Learn more

Join

Upcoming events

26
October

2023 Chinese annual EM meeting

National Academic Annual Conference on Electron Microscopy

October 26-30, 2023
Dongguan, China

Learn more
7
November

Webinar: Optimal sample preparation for large-area transmission Kikuchi diffraction (TKD) analysis

Tuesday, November 7, 2023
10 am EST/4 pm CET

Curious about optimum sample preparation of nanomaterials? Join us for this insightful webinar presented by Dr. Pawel Nowakowski, Senior Applications Scientist at Fischione Instruments (USA), and Dr. Laurie Palasse, Global Application Manager at Bruker Nano Analytics (Germany) to learn about the latest advancements in on-axis TKD and sample preparation techniques for large-area analysis.

Learn more
12
November

2023 ISTFA

49th International Symposium for Testing and Failure Analysis

November 12-16, 2023
Phoenix, AZ USA

Learn more
26
November

2023 MRS

Materials Research Society annual fall meeting and exhibit

November 26 – December 1, 2023
Boston, MA USA

Learn more
28
July

2024 M&M

Microscopy & Microanalysis 2024

July 28 – August 1, 2024
Cleveland, OH USA

Learn more

Let us solve your microscopy and nanotechnology challenges.