An easy-to-use, state-of-the-art, mechanical thinning instrument designed for the reproducible preparation of high-quality transmission electron microscopy specimens
High-quality specimens for transmission electron microscopy need to have a large electron transparent area for analysis, but be rugged. One method that accomplishes both prerequisites is dimpling.
Dimpling is a rapid technique that involves simultaneously rotating the specimen on one axis and a grinding wheel on a perpendicular and intersecting axis. This combination of motions provides a specimen with its central area reduced to a thickness of a few microns. By thinning only the central area of the specimen, a thick, rugged outer rim remains, eliminating the need for special handling techniques for fragile specimens. An abrasive slurry that is in contact with the grinding wheel and the specimen removes the material.
Proper preparation of specimens improves the quality of the resulting transmission electron microscope images.
Multi-scale surface topography is critical to surface function, yet the very smallest scales of topography are not accessible with conventional measurement techniques. Here we demonstrate two separate approaches for measuring small-scale topography in a transmission electron microscope (TEM). The first technique...