We use cookies

By continuing to browse the site, you are agreeing to our use of cookies.

OK Find out more

Model 2050

On-Axis Rotation Tomography Holder

Accepts either rod- or cone-shaped specimens and rotates them fully through 360º about the axis of the holder. Allows 360° image acquisition and tomographic reconstruction without the loss of information due to the missing wedge.

On-Axis Rotation Tomography Holder

Single-axis tomography typically results in a missing wedge of information and dual-axis tomography results in a missing pyramid of information. On-axis rotation tomography yields results without the loss of any information, thus providing the maximum achievable amount of data from the specimen.

The On-Axis Rotation Tomography Holder features a cylindrical specimen cartridge into which a specimen post is inserted. Specimen posts are available in a diameter of either 1.8 mm to accept common atom probe field ion microscope (APFIM) specimen mounts or 1 mm to accept focused ion beam (FIB) prepared specimens.

FIB lift-out techniques are used to transport and attach a thick specimen to the tip of the specimen post. Then the specimen is further FIB-milled into a rod or cone shape and to electron transparency. The specimen post is clamped into the specimen cartridge. The specimen cartridge precisely fits within the body of the holder and is accurately aligned with the eucentric plane of the microscope. The cartridge is rigidly affixed to a mechanism that both moves along and rotates about the axis of the holder.

A dedicated loading station facilitates the positioning of the cartridge into the holder. Once the On-Axis Rotation Tomography Holder is removed from its loading station, the cartridge is mechanically interlocked into the holder.

Initially, the specimen can be fully rotated through 360° to select the proper specimen orientation. A stop is then engaged, which fixes the continuous rotation of the specimen with respect to the holder. A three-position precision indexing mechanism provides the means to orient the specimen in 120° increments. At each increment, while keeping the specimen position fixed with respect to the holder, the microscope’s goniometer is tilted to ±60° to acquire a tomographic tilt series. Indexing the rotation of the specimen by 120° two more times, combined with the ±60° goniometer tilt, yields data corresponding to 360° of specimen rotation. This procedure maximizes the amount of tomographic data obtained from a single specimen.

Included with the holder are a holder loading stand, a Model 9010 Vacuum Storage Container, a cartridge loading station, 1.8 mm and 1 mm cartridges, 1 mm sample posts (pack of 10), FIB stub assembly, and two types of tweezers (Dumont #3 and Dumont 2E1/8).

  • Ideal for specimens prepared by a focused ion beam (FIB) tool
  • Ideal for atom probe tomography (APT) and field ion microscopy (FIM) specimens
  • Three-position index allows precise axial rotation of the specimen
  • Compatible with all pole-piece gap geometries
  • Is compatible with the microscope’s touch alarm, which stops goniometer movement in the event that a pole touch occurs

Available for both JEOL and Thermo Fisher Scientific microscopes.

Barrier efficiency of sponge-like La2Zr2O7 buffer layers for YBCO-coated conductors

Solution derived La2Zr2O7 films have drawn much attention for potential applications as thermal barriers or low-cost buffer layers for coated conductor technology. Annealing and coating parameters strongly affect the microstructure of La2Zr2O7, but different film processing methods can yield similar microstructural...

Computed tomographic spectral imaging: 3D STEM-EDS spectral imaging

Spectral imaging, where complete x-ray spectra are acquired from 2D or 3D arrays of points, is a powerful microanalytical technique, especially when combined with multivariate statistical analysis. Chemical imaging, typically spectroscopic imaging or mapping with energy-loss electrons or x-rays has been performed on...

Measuring porosity at the nanoscale by quantitative electron tomography

Quantitative electron tomography is proposed to characterize porous materials at a nanoscale. To achieve reliable three dimensional (3D) quantitative information, the influence of missing wedge artifacts and segmentation methods is investigated. We are presenting the "discrete slgebraic teconstruction algorithm" as...

TEM investigations of gate-all-around nanowire devices

Nano beam diffraction and geometric phase analysis of high-resolution scanning TEM (STEM) images are used in to evaluate strain at the nm-scale along the nanowires at different steps of the fabrication process. Initially strained Ge layers, in the early stages of the GAA NWs fabrication, relax after the fin-reveal...

Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts

The three-dimensional (3D) distribution of carbon nanotubes (CNTs) grown inside semiconductor contact holes is studied by electron tomography. The use of a specialized tomography holder results in an angular tilt range of ±90°, which means that the so-called "missing wedge" is absent. The transmission electron...

Want to learn more?

Fill out the contact form below and we will get in touch to discuss your sample preparation needs.