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Model 2040

Dual-Axis Tomography Holder

Features an optimal tilt angle range in narrow gap (~ 5 mm) pole-piece geometries while maintaining microscope resolution.
Dual-Axis Tomography Holder

The Model 2040 Dual-Axis Tomography Holder is for room-temperature applications when TEM tomographic imaging or analysis requires in-plane rotation of the specimen. The Dual-Axis Tomography Holder features an optimal tilt-angle range. The holder features a fully jeweled mechanism for ultra-precise specimen movement, which yields highly repeatable specimen rotation while maintaining eucentric height.

Initially, the specimen can be rotated fully through 360°. Once the specimen is properly oriented, a two-position precision mechanism allows 90° in-plane rotation of the specimen. This feature greatly facilitates the acquisition of a dual-axis tilt series. The holder features a FlexiClamp, a spring-type, annular ring that securely clamps the specimen into the specimen cup. It maximizes specimen visibility, even at high-tilt angles.

Included with the holder are a holder stand, a Model 9010 Vacuum Storage Container, FlexiClamp (pack of 10), and a FlexiClamp tool.

The holder:

  • Has a fully jeweled mechanism for ultra-precise planar specimen rotation
  • Is optimized tilt in pole-piece gaps as small as 5 mm
  • Offers an extended field of view
  • Is compatible with the TEM’s touch alarm, which stops goniometer movement in the event that a pole touch occurs

Available for both JEOL and Thermo Fisher Scientific microscopes.

Learn more about another in-plane rotation tomography holder option: Model 2045 Motorized Dual-Axis Tomography Holder. This holder offers motorized rotational control and interfaces with Thermo Fisher Scientific’s transmission electron microscopes’ control system.

Reducing the missing wedge: High-resolution dual axis tomography of inorganic materials

Electron tomography is a powerful technique that can probe the three-dimensional (3-D) structure of materials. Recently, this technique has been successfully applied to inorganic materials using Z-contrast imaging in a scanning transmission electron microscope to image nanomaterials in 3-D with a resolution of 1 nm...

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