Application notes

Looking for help with preparing a sample or specimen for electron microscopy? The links on this page will lead you to applications notes for various instruments. On these pages you will find instrument specific tips, as well as preparation parameters for various materials. If you don't find the specific material you are trying to prepare, contact applications@fischione.com for assistance.

Conventional preparation

 

The role of TEM specimen preparation in understanding aluminum alloy precipitation hardening mechanism

Model 110 Automatic Twin-Jet Electropolisher

Model 1040 NanoMill® TEM specimen preparation system 

Silicon plan view specimen preparation for transmission electron microscopy

Model 160 Specimen Grinder

Model 170 Ultrasonic Disk Cutter

Model 200 Dimpling Grinder

Silicon cross-section specimen preparation for transmission electron microscopy

Model 160 Specimen Grinder

Model 170 Ultrasonic Disk Cutter

Model 180 XTEM Prep Kit

Model 200 Dimpling Grinder

Cutting disk specimens for transmission electron microscopy

Model 170 Ultrasonic Disk Cutter
Plasma cleaning  
Plasma cleaning of carbon films for transmission electron microscopy

Model 1020 Plasma Cleaner

Model 1070 NanoClean
Preparing hydrophilic, carbon-supported grids for cryo electron microscopy

Model 1070 NanoClean
Ion beam preparation

 
The role of TEM specimen preparation in understanding aluminum alloy precipitation hardening mechanism

Model 110 Automatic Twin-Jet Electropolisher

 

Model 1040 NanoMill® TEM specimen preparation system 
Model 1040 NanoMill® TEM specimen preparation system specimen configuration

Model 1040 NanoMill® TEM specimen preparation system
Removal of amorphous layer from nanoneedle specimens fabricated by focused ion beam

Model 1040 NanoMill® TEM specimen preparation system
Solder bump sample preparation for failure analysis

Model 1061 SEM Mill
Model 1080 PicoMill® TEM specimen preparation system specimen configuration

Model 1080 PicoMill® TEM specimen preparation system
Imaging

 
Annular Dark Field Detector operating principles Model 3000 Annular Dark Field (ADF) Detector

NanoMill and PicoMill are registered trademark of E.A. Fischione Instruments, Inc.